Castellazzi, A., Fayyaz, A., & Kraus, R. (2018). SiC MOSFET device parameter spread and ruggedness of parallel multichip structures. Trans Tech Publications.
Chicago Style (17th ed.) CitationCastellazzi, Alberto, Asad Fayyaz, and Rainer Kraus. SiC MOSFET Device Parameter Spread and Ruggedness of Parallel Multichip Structures. Trans Tech Publications, 2018.
MLA (9th ed.) CitationCastellazzi, Alberto, et al. SiC MOSFET Device Parameter Spread and Ruggedness of Parallel Multichip Structures. Trans Tech Publications, 2018.
Warning: These citations may not always be 100% accurate.