TEM tomography of pores with application to computational nanoscale flows in nanoporous silicon nitride (NPN)

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TEM tomography of pores with application to computational nanoscale flows in nanoporous silicon nitride (NPN)

Silicon nanomembrane technologies (NPN, pnc-Si, and others) have been used commercially as electron microscopy (EM) substrates, and as filters with nanometer-resolution size cut-offs. Combined with EM, these materials provide a platform for catching or suspending nanoscale-size structures for analys...

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Bibliographic Details
Main Authors:	Madejski, Gregory, Lucas, Kilean, Pascut, Flavius C., Webb, Kevin F., McGrath, James L.
Format:	Article
Published:	MDPI 2018
Subjects:	TEM; Tomography; Nanomembranes; NPN
Online Access:	https://eprints.nottingham.ac.uk/52263/

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