TEM tomography of pores with application to computational nanoscale flows in nanoporous silicon nitride (NPN)
Silicon nanomembrane technologies (NPN, pnc-Si, and others) have been used commercially as electron microscopy (EM) substrates, and as filters with nanometer-resolution size cut-offs. Combined with EM, these materials provide a platform for catching or suspending nanoscale-size structures for analys...
| Main Authors: | , , , , |
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| Format: | Article |
| Published: |
MDPI
2018
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| Subjects: | |
| Online Access: | https://eprints.nottingham.ac.uk/52263/ |