Information-rich surface metrology
Information-rich metrology refers to the incorporation of any type of available information in the data acquisition and processing pipeline of a measurement process, in order to improve the efficiency and quality of the measurement. In this work, the information-rich metrology paradigm is explored a...
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| Format: | Article |
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Elsevier
2018
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| Online Access: | https://eprints.nottingham.ac.uk/51923/ |
| _version_ | 1848798605233618944 |
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| author | Senin, Nicola Leach, Richard K. |
| author_facet | Senin, Nicola Leach, Richard K. |
| author_sort | Senin, Nicola |
| building | Nottingham Research Data Repository |
| collection | Online Access |
| description | Information-rich metrology refers to the incorporation of any type of available information in the data acquisition and processing pipeline of a measurement process, in order to improve the efficiency and quality of the measurement. In this work, the information-rich metrology paradigm is explored as it is applied to the measurement and characterisation of surface topography. The advantages and challenges of introducing heterogeneous information sources in the surface characterisation pipeline are illustrated. Examples are provided about the incorporation of structured knowledge about a part nominal geometry, the manufacturing processes with their signature topographic features and set-up parameters, and the measurement instruments with their performance characteristics and behaviour in relation to the specific properties of the surfaces being measured. A wide array of surface metrology applications, ranging from product inspection, to surface classification, to defect identification and to the investigation of advanced manufacturing processes, is used to illustrate the information-rich paradigm. |
| first_indexed | 2025-11-14T20:22:25Z |
| format | Article |
| id | nottingham-51923 |
| institution | University of Nottingham Malaysia Campus |
| institution_category | Local University |
| last_indexed | 2025-11-14T20:22:25Z |
| publishDate | 2018 |
| publisher | Elsevier |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | nottingham-519232020-05-04T19:36:30Z https://eprints.nottingham.ac.uk/51923/ Information-rich surface metrology Senin, Nicola Leach, Richard K. Information-rich metrology refers to the incorporation of any type of available information in the data acquisition and processing pipeline of a measurement process, in order to improve the efficiency and quality of the measurement. In this work, the information-rich metrology paradigm is explored as it is applied to the measurement and characterisation of surface topography. The advantages and challenges of introducing heterogeneous information sources in the surface characterisation pipeline are illustrated. Examples are provided about the incorporation of structured knowledge about a part nominal geometry, the manufacturing processes with their signature topographic features and set-up parameters, and the measurement instruments with their performance characteristics and behaviour in relation to the specific properties of the surfaces being measured. A wide array of surface metrology applications, ranging from product inspection, to surface classification, to defect identification and to the investigation of advanced manufacturing processes, is used to illustrate the information-rich paradigm. Elsevier 2018-09-03 Article PeerReviewed Senin, Nicola and Leach, Richard K. (2018) Information-rich surface metrology. Procedia CIRP, 75 . pp. 19-26. ISSN 2212-8271 Surface metrology; areal topography characterisation; information rich metrology https://www.sciencedirect.com/science/article/pii/S2212827118306310 doi:10.1016/j.procir.2018.05.003 doi:10.1016/j.procir.2018.05.003 |
| spellingShingle | Surface metrology; areal topography characterisation; information rich metrology Senin, Nicola Leach, Richard K. Information-rich surface metrology |
| title | Information-rich surface metrology |
| title_full | Information-rich surface metrology |
| title_fullStr | Information-rich surface metrology |
| title_full_unstemmed | Information-rich surface metrology |
| title_short | Information-rich surface metrology |
| title_sort | information-rich surface metrology |
| topic | Surface metrology; areal topography characterisation; information rich metrology |
| url | https://eprints.nottingham.ac.uk/51923/ https://eprints.nottingham.ac.uk/51923/ https://eprints.nottingham.ac.uk/51923/ |