Co-design/simulation of flip-chip assembly for high voltage IGBT packages

This paper details a co-design and modelling methodology to optimise the flip-chip assembly parameters so that the overall package and system meets performance and reliability specifications for LED lighting applications. A co-design methodology is employed between device level modelling and package...

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Main Authors: Rajaguru, P., Bailey, Christopher, Aliyu, Attahir Murtala, Castellazzi, Alberto, Pathirana, V., Udugampola, N., Trajkovic, T., Udrea, F., Mitchelson, P.D., Elliot, A.D.T.
Format: Conference or Workshop Item
Published: 2017
Online Access:https://eprints.nottingham.ac.uk/51686/
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author Rajaguru, P.
Bailey, Christopher
Aliyu, Attahir Murtala
Castellazzi, Alberto
Pathirana, V.
Udugampola, N.
Trajkovic, T.
Udrea, F.
Mitchelson, P.D.
Elliot, A.D.T.
author_facet Rajaguru, P.
Bailey, Christopher
Aliyu, Attahir Murtala
Castellazzi, Alberto
Pathirana, V.
Udugampola, N.
Trajkovic, T.
Udrea, F.
Mitchelson, P.D.
Elliot, A.D.T.
author_sort Rajaguru, P.
building Nottingham Research Data Repository
collection Online Access
description This paper details a co-design and modelling methodology to optimise the flip-chip assembly parameters so that the overall package and system meets performance and reliability specifications for LED lighting applications. A co-design methodology is employed between device level modelling and package level modelling in order enhance the flow of information. As part of this methodology, coupled electrical, thermal and mechniacal predictions are made in order to mitigate underfill dielectric breakdown failure and solder interconnect fatigue failure. Five commercial underfills were selected for investigating the trade-off in materials properties that mitigate underfill electrical breakdown and solder joint fatigue.
first_indexed 2025-11-14T20:21:34Z
format Conference or Workshop Item
id nottingham-51686
institution University of Nottingham Malaysia Campus
institution_category Local University
last_indexed 2025-11-14T20:21:34Z
publishDate 2017
recordtype eprints
repository_type Digital Repository
spelling nottingham-516862020-05-04T19:08:42Z https://eprints.nottingham.ac.uk/51686/ Co-design/simulation of flip-chip assembly for high voltage IGBT packages Rajaguru, P. Bailey, Christopher Aliyu, Attahir Murtala Castellazzi, Alberto Pathirana, V. Udugampola, N. Trajkovic, T. Udrea, F. Mitchelson, P.D. Elliot, A.D.T. This paper details a co-design and modelling methodology to optimise the flip-chip assembly parameters so that the overall package and system meets performance and reliability specifications for LED lighting applications. A co-design methodology is employed between device level modelling and package level modelling in order enhance the flow of information. As part of this methodology, coupled electrical, thermal and mechniacal predictions are made in order to mitigate underfill dielectric breakdown failure and solder interconnect fatigue failure. Five commercial underfills were selected for investigating the trade-off in materials properties that mitigate underfill electrical breakdown and solder joint fatigue. 2017-09-27 Conference or Workshop Item PeerReviewed Rajaguru, P., Bailey, Christopher, Aliyu, Attahir Murtala, Castellazzi, Alberto, Pathirana, V., Udugampola, N., Trajkovic, T., Udrea, F., Mitchelson, P.D. and Elliot, A.D.T. (2017) Co-design/simulation of flip-chip assembly for high voltage IGBT packages. In: 23rd International Workshop on Thermal Investigations of ICs and Systems, THERMINIC 2017, 27-29 September 2018, Amsterdam, Netherlands. https://ieeexplore.ieee.org/document/8233847/
spellingShingle Rajaguru, P.
Bailey, Christopher
Aliyu, Attahir Murtala
Castellazzi, Alberto
Pathirana, V.
Udugampola, N.
Trajkovic, T.
Udrea, F.
Mitchelson, P.D.
Elliot, A.D.T.
Co-design/simulation of flip-chip assembly for high voltage IGBT packages
title Co-design/simulation of flip-chip assembly for high voltage IGBT packages
title_full Co-design/simulation of flip-chip assembly for high voltage IGBT packages
title_fullStr Co-design/simulation of flip-chip assembly for high voltage IGBT packages
title_full_unstemmed Co-design/simulation of flip-chip assembly for high voltage IGBT packages
title_short Co-design/simulation of flip-chip assembly for high voltage IGBT packages
title_sort co-design/simulation of flip-chip assembly for high voltage igbt packages
url https://eprints.nottingham.ac.uk/51686/
https://eprints.nottingham.ac.uk/51686/