Formation routes and structural details of the CaF1 layer on Si(111) from high-resolution noncontact atomic force microscopy data

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Formation routes and structural details of the CaF1 layer on Si(111) from high-resolution noncontact atomic force microscopy data

We investigate the CaF1/Si(111) interface using a combination of high-resolution scanning tunnelling and noncontact atomic force microscopy operated at cryogenic temperature as well as x-ray photoelectron spectroscopy. Submonolayer CaF1 films grown at substrate temperatures between 550 and 600 ◦C on...

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Bibliographic Details
Main Authors:	Rahe, Philipp, Smith, Emily F., Wollschläger, Joachim, Moriarty, Philip J.
Format:	Article
Language:	English
Published:	American Physical Society 2018
Online Access:	https://eprints.nottingham.ac.uk/51009/

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