Formation routes and structural details of the CaF1 layer on Si(111) from high-resolution noncontact atomic force microscopy data
We investigate the CaF1/Si(111) interface using a combination of high-resolution scanning tunnelling and noncontact atomic force microscopy operated at cryogenic temperature as well as x-ray photoelectron spectroscopy. Submonolayer CaF1 films grown at substrate temperatures between 550 and 600 ◦C on...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
American Physical Society
2018
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| Online Access: | https://eprints.nottingham.ac.uk/51009/ |