APA (7th ed.) Citation

Yang, L., Li, K., Dai, J., Corfield, M., Harris, A., Paciura, K., . . . Johnson, C. M. (2018). Electrical performance and reliability characterization of a SiC MOSFET power module with embedded decoupling capacitors. Institute of Electrical and Electronics Engineers.

Chicago Style (17th ed.) Citation

Yang, Li, Ke Li, Jingru Dai, Martin Corfield, Anne Harris, Krzysztof Paciura, John O'Brien, and C. Mark Johnson. Electrical Performance and Reliability Characterization of a SiC MOSFET Power Module with Embedded Decoupling Capacitors. Institute of Electrical and Electronics Engineers, 2018.

MLA (9th ed.) Citation

Yang, Li, et al. Electrical Performance and Reliability Characterization of a SiC MOSFET Power Module with Embedded Decoupling Capacitors. Institute of Electrical and Electronics Engineers, 2018.