Effects of magnification and sampling resolution in X-ray computed tomography for the measurement of additively manufactured metal surfaces
Recent studies have shown that X-ray computed tomography (XCT) can be used to measure the surface topography of additively manufactured parts. However, further research is necessary to fully understand XCT measurement performance. Here, we show how magnification of the X-ray projections and resoluti...
| Main Authors: | , , , |
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| Format: | Article |
| Published: |
Elsevier
2018
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| Subjects: | |
| Online Access: | https://eprints.nottingham.ac.uk/50303/ |