APA (7th ed.) Citation

Fayyaz, A., Castellazzi, A., Romano, G., Riccio, M., Urresti, J., & Wright, N. (2017). Influence of gate bias on the avalanche ruggedness of SiC power MOSFETs.

Chicago Style (17th ed.) Citation

Fayyaz, Asad, Alberto Castellazzi, G. Romano, M. Riccio, J. Urresti, and N. Wright. Influence of Gate Bias on the Avalanche Ruggedness of SiC Power MOSFETs. 2017.

MLA (9th ed.) Citation

Fayyaz, Asad, et al. Influence of Gate Bias on the Avalanche Ruggedness of SiC Power MOSFETs. 2017.