Built-in reliability design of a high-frequency SiC MOSFET power module

A high frequency SiC MOSFET-based three-phase, 2-level power module has been designed, simulated, assembled and tested. The design followed a built-in reliability approach, involving extensive finite-element simulation based analysis of the electro-thermo-mechanical strain and stress affecting the s...

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Main Authors: Li, Jianfeng, Gurpinar, Emre, Lopez Arevalo, Saul, Castellazzi, Alberto, Mills, Liam
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:https://eprints.nottingham.ac.uk/44169/
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author Li, Jianfeng
Gurpinar, Emre
Lopez Arevalo, Saul
Castellazzi, Alberto
Mills, Liam
author_facet Li, Jianfeng
Gurpinar, Emre
Lopez Arevalo, Saul
Castellazzi, Alberto
Mills, Liam
author_sort Li, Jianfeng
building Nottingham Research Data Repository
collection Online Access
description A high frequency SiC MOSFET-based three-phase, 2-level power module has been designed, simulated, assembled and tested. The design followed a built-in reliability approach, involving extensive finite-element simulation based analysis of the electro-thermo-mechanical strain and stress affecting the switch during both manufacturing and operation: structural simulations were carried out to identify the materials, geometry and sizes of constituent parts which would maximize reliability. Following hardware development, functional tests were carried out, showing that the module is suitable for high switching frequency operation without impairing efficiency, thus enabling a considerable reduction of system-level size and weight.
first_indexed 2025-11-14T19:54:35Z
format Conference or Workshop Item
id nottingham-44169
institution University of Nottingham Malaysia Campus
institution_category Local University
last_indexed 2025-11-14T19:54:35Z
publishDate 2014
recordtype eprints
repository_type Digital Repository
spelling nottingham-441692020-05-04T16:52:43Z https://eprints.nottingham.ac.uk/44169/ Built-in reliability design of a high-frequency SiC MOSFET power module Li, Jianfeng Gurpinar, Emre Lopez Arevalo, Saul Castellazzi, Alberto Mills, Liam A high frequency SiC MOSFET-based three-phase, 2-level power module has been designed, simulated, assembled and tested. The design followed a built-in reliability approach, involving extensive finite-element simulation based analysis of the electro-thermo-mechanical strain and stress affecting the switch during both manufacturing and operation: structural simulations were carried out to identify the materials, geometry and sizes of constituent parts which would maximize reliability. Following hardware development, functional tests were carried out, showing that the module is suitable for high switching frequency operation without impairing efficiency, thus enabling a considerable reduction of system-level size and weight. 2014-08-07 Conference or Workshop Item PeerReviewed Li, Jianfeng, Gurpinar, Emre, Lopez Arevalo, Saul, Castellazzi, Alberto and Mills, Liam (2014) Built-in reliability design of a high-frequency SiC MOSFET power module. In: 7th International Power Electronics Conference (IPEC Hiroshima 2014 ECCE- ASIA), 18-21 May 2014, Hiroshima, Japan. SiC MOSFET multi-chip power modules reliability. http://ieeexplore.ieee.org/document/6870033/
spellingShingle SiC MOSFET
multi-chip power modules
reliability.
Li, Jianfeng
Gurpinar, Emre
Lopez Arevalo, Saul
Castellazzi, Alberto
Mills, Liam
Built-in reliability design of a high-frequency SiC MOSFET power module
title Built-in reliability design of a high-frequency SiC MOSFET power module
title_full Built-in reliability design of a high-frequency SiC MOSFET power module
title_fullStr Built-in reliability design of a high-frequency SiC MOSFET power module
title_full_unstemmed Built-in reliability design of a high-frequency SiC MOSFET power module
title_short Built-in reliability design of a high-frequency SiC MOSFET power module
title_sort built-in reliability design of a high-frequency sic mosfet power module
topic SiC MOSFET
multi-chip power modules
reliability.
url https://eprints.nottingham.ac.uk/44169/
https://eprints.nottingham.ac.uk/44169/