Fayyaz, A., Romano, G., Urresti, J., Riccio, M., Castellazzi, A., Irace, A., & Wright, N. (2017). A comprehensive study on the avalanche breakdown robustness of silicon carbide power MOSFETs. MDPI.
Chicago Style (17th ed.) CitationFayyaz, Asad, Gianpaolo Romano, Jesus Urresti, Michele Riccio, Alberto Castellazzi, Andrea Irace, and Nick Wright. A Comprehensive Study on the Avalanche Breakdown Robustness of Silicon Carbide Power MOSFETs. MDPI, 2017.
MLA (9th ed.) CitationFayyaz, Asad, et al. A Comprehensive Study on the Avalanche Breakdown Robustness of Silicon Carbide Power MOSFETs. MDPI, 2017.
Warning: These citations may not always be 100% accurate.