APA (7th ed.) Citation

Feng, X., Pascal, J., & Lawes, S. (2017). A microscopy approach for in situ inspection of the μCMM stylus for contamination. IOP Publishing.

Chicago Style (17th ed.) Citation

Feng, Xiaobing, Jonathan Pascal, and Simon Lawes. A Microscopy Approach for in Situ Inspection of the μCMM Stylus for Contamination. IOP Publishing, 2017.

MLA (9th ed.) Citation

Feng, Xiaobing, et al. A Microscopy Approach for in Situ Inspection of the μCMM Stylus for Contamination. IOP Publishing, 2017.