A microscopy approach for in situ inspection of the μCMM stylus for contamination
During the µCMM measurement process, contamination gradually builds up on the surface of the stylus tip and affects dimensional accuracy of the measurement. Regular inspection of the stylus for contamination is essential in determining the appropriate cleaning interval and preventing the dimensional...
| Main Authors: | , , |
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| Format: | Article |
| Published: |
IOP Publishing
2017
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| Subjects: | |
| Online Access: | https://eprints.nottingham.ac.uk/44056/ |