Ekberg, P., Su, R., & Leach, R. K. (2017). High-precision lateral distortion measurement and correction in coherence scanning interferometry using an arbitrary surface. Optical Society of America.
Chicago Style (17th ed.) CitationEkberg, Peter, Rong Su, and Richard K. Leach. High-precision Lateral Distortion Measurement and Correction in Coherence Scanning Interferometry Using an Arbitrary Surface. Optical Society of America, 2017.
MLA (9th ed.) CitationEkberg, Peter, et al. High-precision Lateral Distortion Measurement and Correction in Coherence Scanning Interferometry Using an Arbitrary Surface. Optical Society of America, 2017.
Warning: These citations may not always be 100% accurate.