$Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method$
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Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method

The well-known method presented by Swanepoel can be used to determine the refractive index dispersion of thin films in the near-infrared region from wavelength values at maxima and minima, only, of the transmission interference fringes. In order to extend this method into the mid-infrared (MIR) spec...

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Bibliographic Details
Main Authors:	Fang, Y., Jayasuriya, D., Furniss, D., Tang, Z.Q., Sojka, Ł., Markos, C., Sujecki, S., Seddon, A.B., Benson, T.M.
Format:	Article
Published:	Springer 2017
Online Access:	https://eprints.nottingham.ac.uk/43329/

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