Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method
The well-known method presented by Swanepoel can be used to determine the refractive index dispersion of thin films in the near-infrared region from wavelength values at maxima and minima, only, of the transmission interference fringes. In order to extend this method into the mid-infrared (MIR) spec...
| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Published: |
Springer
2017
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| Online Access: | https://eprints.nottingham.ac.uk/43329/ |