APA (7th ed.) Citation

Fang, Y., Jayasuriya, D., Furniss, D., Tang, Z., Sojka, Ł., Markos, C., . . . Benson, T. (2017). Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method. Springer.

Chicago Style (17th ed.) Citation

Fang, Y., D. Jayasuriya, D. Furniss, Z.Q Tang, Ł Sojka, C. Markos, S. Sujecki, A.B Seddon, and T.M Benson. Determining the Refractive Index Dispersion and Thickness of Hot-pressed Chalcogenide Thin Films from an Improved Swanepoel Method. Springer, 2017.

MLA (9th ed.) Citation

Fang, Y., et al. Determining the Refractive Index Dispersion and Thickness of Hot-pressed Chalcogenide Thin Films from an Improved Swanepoel Method. Springer, 2017.