Fayyaz, A., Castellazzi, A., Romano, G., Riccio, M., Urresti, J., & Wright, N. (2016). UIS failure mechanism of SiC power MOSFETs.
Chicago Style (17th ed.) CitationFayyaz, Asad, Alberto Castellazzi, Gianpaolo Romano, Michele Riccio, J. Urresti, and Nick Wright. UIS Failure Mechanism of SiC Power MOSFETs. 2016.
MLA (9th ed.) CitationFayyaz, Asad, et al. UIS Failure Mechanism of SiC Power MOSFETs. 2016.
Warning: These citations may not always be 100% accurate.