Statistical description of inhomogeneous samples by scanning microwave microscopy
A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a known ceramic material. The SMM suitable for this tas...
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| Format: | Article |
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Institute of Electrical and Electronics Engineers
2017
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| Online Access: | https://eprints.nottingham.ac.uk/40135/ |
| _version_ | 1848795991867654144 |
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| author | Monti, Tamara Udoudo, O.B. Sperin, Kevin A. Dodds, Chris Kingman, S.W. Jackson, Timothy J. |
| author_facet | Monti, Tamara Udoudo, O.B. Sperin, Kevin A. Dodds, Chris Kingman, S.W. Jackson, Timothy J. |
| author_sort | Monti, Tamara |
| building | Nottingham Research Data Repository |
| collection | Online Access |
| description | A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a known ceramic material. The SMM suitable for this task employs relatively large tips (tens of micrometers in diameter). Additionally, in order to make the instrument more suitable for high-throughput analysis, an original design for rapid tip changes is implemented. Single-point measurements of dielectric constant at random locations on the sample were performed, leading to histograms of dielectric constant values. These are related to the dielectric constants of the two phases using Maxwell–Garnett effective medium theory, taking into account the volume-of-interaction in the sample beneath the tip. |
| first_indexed | 2025-11-14T19:40:53Z |
| format | Article |
| id | nottingham-40135 |
| institution | University of Nottingham Malaysia Campus |
| institution_category | Local University |
| last_indexed | 2025-11-14T19:40:53Z |
| publishDate | 2017 |
| publisher | Institute of Electrical and Electronics Engineers |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | nottingham-401352020-05-04T18:48:06Z https://eprints.nottingham.ac.uk/40135/ Statistical description of inhomogeneous samples by scanning microwave microscopy Monti, Tamara Udoudo, O.B. Sperin, Kevin A. Dodds, Chris Kingman, S.W. Jackson, Timothy J. A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a known ceramic material. The SMM suitable for this task employs relatively large tips (tens of micrometers in diameter). Additionally, in order to make the instrument more suitable for high-throughput analysis, an original design for rapid tip changes is implemented. Single-point measurements of dielectric constant at random locations on the sample were performed, leading to histograms of dielectric constant values. These are related to the dielectric constants of the two phases using Maxwell–Garnett effective medium theory, taking into account the volume-of-interaction in the sample beneath the tip. Institute of Electrical and Electronics Engineers 2017-06-01 Article PeerReviewed Monti, Tamara, Udoudo, O.B., Sperin, Kevin A., Dodds, Chris, Kingman, S.W. and Jackson, Timothy J. (2017) Statistical description of inhomogeneous samples by scanning microwave microscopy. IEEE Transactions on Microwave Theory and Techniques, 65 (6). pp. 2162-2170. ISSN 0018-9480 Dielectric constant dielectric materials Maxwell–Garnett approximation microwave measurements near-field measurements nonhomogeneous media scanning microwave microscope (SMM) statistical distributions http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=7827118 doi:10.1109/TMTT.2016.2642940 doi:10.1109/TMTT.2016.2642940 |
| spellingShingle | Dielectric constant dielectric materials Maxwell–Garnett approximation microwave measurements near-field measurements nonhomogeneous media scanning microwave microscope (SMM) statistical distributions Monti, Tamara Udoudo, O.B. Sperin, Kevin A. Dodds, Chris Kingman, S.W. Jackson, Timothy J. Statistical description of inhomogeneous samples by scanning microwave microscopy |
| title | Statistical description of inhomogeneous samples by scanning microwave microscopy |
| title_full | Statistical description of inhomogeneous samples by scanning microwave microscopy |
| title_fullStr | Statistical description of inhomogeneous samples by scanning microwave microscopy |
| title_full_unstemmed | Statistical description of inhomogeneous samples by scanning microwave microscopy |
| title_short | Statistical description of inhomogeneous samples by scanning microwave microscopy |
| title_sort | statistical description of inhomogeneous samples by scanning microwave microscopy |
| topic | Dielectric constant dielectric materials Maxwell–Garnett approximation microwave measurements near-field measurements nonhomogeneous media scanning microwave microscope (SMM) statistical distributions |
| url | https://eprints.nottingham.ac.uk/40135/ https://eprints.nottingham.ac.uk/40135/ https://eprints.nottingham.ac.uk/40135/ |