Statistical description of inhomogeneous samples by scanning microwave microscopy
A quantitative analysis of the dielectric properties of a multiphase sample using a scanning microwave microscope (SMM) is proposed. The method is demonstrated using inhomogeneous samples composed of a resin containing micrometric inclusions of a known ceramic material. The SMM suitable for this tas...
| Main Authors: | , , , , , |
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| Format: | Article |
| Published: |
Institute of Electrical and Electronics Engineers
2017
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| Subjects: | |
| Online Access: | https://eprints.nottingham.ac.uk/40135/ |