Monti, T., Udoudo, O., Sperin, K. A., Dodds, C., Kingman, S., & Jackson, T. J. (2017). Statistical description of inhomogeneous samples by scanning microwave microscopy. Institute of Electrical and Electronics Engineers.
Chicago Style (17th ed.) CitationMonti, Tamara, O.B Udoudo, Kevin A. Sperin, Chris Dodds, S.W Kingman, and Timothy J. Jackson. Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy. Institute of Electrical and Electronics Engineers, 2017.
MLA (9th ed.) CitationMonti, Tamara, et al. Statistical Description of Inhomogeneous Samples by Scanning Microwave Microscopy. Institute of Electrical and Electronics Engineers, 2017.
Warning: These citations may not always be 100% accurate.