Interfacial contribution to thickness dependent in-plane anisotropic magnetoresistance

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Interfacial contribution to thickness dependent in-plane anisotropic magnetoresistance

We have studied in-plane anisotropic magnetoresistance (AMR) in cobalt films with overlayers having designed electrically interface transparency. With an electrically opaque cobalt/overlayer interface, the AMR ratio is shown to vary in inverse proportion to the cobalt film thickness; an indication t...

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Bibliographic Details
Main Authors:	Tokaç, M., Wang, M., Jaiswal, Shashank, Rushforth, A.W., Gallagher, B.L., Atkinson, D., Hindmarch, A.T.
Format:	Article
Published:	AIP Publishing 2015
Online Access:	https://eprints.nottingham.ac.uk/37055/

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