Interfacial contribution to thickness dependent in-plane anisotropic magnetoresistance
We have studied in-plane anisotropic magnetoresistance (AMR) in cobalt films with overlayers having designed electrically interface transparency. With an electrically opaque cobalt/overlayer interface, the AMR ratio is shown to vary in inverse proportion to the cobalt film thickness; an indication t...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Published: |
AIP Publishing
2015
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| Online Access: | https://eprints.nottingham.ac.uk/37055/ |