Interfacial contribution to thickness dependent in-plane anisotropic magnetoresistance
We have studied in-plane anisotropic magnetoresistance (AMR) in cobalt films with overlayers having designed electrically interface transparency. With an electrically opaque cobalt/overlayer interface, the AMR ratio is shown to vary in inverse proportion to the cobalt film thickness; an indication t...
| Main Authors: | , , , , , , |
|---|---|
| Format: | Article |
| Published: |
AIP Publishing
2015
|
| Online Access: | https://eprints.nottingham.ac.uk/37055/ |
| _version_ | 1848795383067574272 |
|---|---|
| author | Tokaç, M. Wang, M. Jaiswal, Shashank Rushforth, A.W. Gallagher, B.L. Atkinson, D. Hindmarch, A.T. |
| author_facet | Tokaç, M. Wang, M. Jaiswal, Shashank Rushforth, A.W. Gallagher, B.L. Atkinson, D. Hindmarch, A.T. |
| author_sort | Tokaç, M. |
| building | Nottingham Research Data Repository |
| collection | Online Access |
| description | We have studied in-plane anisotropic magnetoresistance (AMR) in cobalt films with overlayers having designed electrically interface transparency. With an electrically opaque cobalt/overlayer interface, the AMR ratio is shown to vary in inverse proportion to the cobalt film thickness; an indication that in-plane AMR is a consequence of anisotropic scattering with both volume and interfacial contributions. The interface scattering anisotropy opposes the volume scattering contribution, causing the AMR ratio to diminish as the cobalt film thickness is reduced. An intrinsic interface effect explains the significantly reduced AMR ratio in ultra-thin films. |
| first_indexed | 2025-11-14T19:31:13Z |
| format | Article |
| id | nottingham-37055 |
| institution | University of Nottingham Malaysia Campus |
| institution_category | Local University |
| last_indexed | 2025-11-14T19:31:13Z |
| publishDate | 2015 |
| publisher | AIP Publishing |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | nottingham-370552020-05-04T17:28:04Z https://eprints.nottingham.ac.uk/37055/ Interfacial contribution to thickness dependent in-plane anisotropic magnetoresistance Tokaç, M. Wang, M. Jaiswal, Shashank Rushforth, A.W. Gallagher, B.L. Atkinson, D. Hindmarch, A.T. We have studied in-plane anisotropic magnetoresistance (AMR) in cobalt films with overlayers having designed electrically interface transparency. With an electrically opaque cobalt/overlayer interface, the AMR ratio is shown to vary in inverse proportion to the cobalt film thickness; an indication that in-plane AMR is a consequence of anisotropic scattering with both volume and interfacial contributions. The interface scattering anisotropy opposes the volume scattering contribution, causing the AMR ratio to diminish as the cobalt film thickness is reduced. An intrinsic interface effect explains the significantly reduced AMR ratio in ultra-thin films. AIP Publishing 2015-12-07 Article PeerReviewed Tokaç, M., Wang, M., Jaiswal, Shashank, Rushforth, A.W., Gallagher, B.L., Atkinson, D. and Hindmarch, A.T. (2015) Interfacial contribution to thickness dependent in-plane anisotropic magnetoresistance. AIP Advances, 5 . 127108/1-127108/7. ISSN 2158-3226 http://scitation.aip.org/content/aip/journal/adva/5/12/10.1063/1.4937556 doi:10.1063/1.4937556 doi:10.1063/1.4937556 |
| spellingShingle | Tokaç, M. Wang, M. Jaiswal, Shashank Rushforth, A.W. Gallagher, B.L. Atkinson, D. Hindmarch, A.T. Interfacial contribution to thickness dependent in-plane anisotropic magnetoresistance |
| title | Interfacial contribution to thickness dependent in-plane anisotropic magnetoresistance |
| title_full | Interfacial contribution to thickness dependent in-plane anisotropic magnetoresistance |
| title_fullStr | Interfacial contribution to thickness dependent in-plane anisotropic magnetoresistance |
| title_full_unstemmed | Interfacial contribution to thickness dependent in-plane anisotropic magnetoresistance |
| title_short | Interfacial contribution to thickness dependent in-plane anisotropic magnetoresistance |
| title_sort | interfacial contribution to thickness dependent in-plane anisotropic magnetoresistance |
| url | https://eprints.nottingham.ac.uk/37055/ https://eprints.nottingham.ac.uk/37055/ https://eprints.nottingham.ac.uk/37055/ |