APA (7th ed.) Citation

Fayyaz, A., & Castellazzi, A. (2015). High temperature pulsed-gate robustness testing of SiC power MOSFETs. Elsevier.

Chicago Style (17th ed.) Citation

Fayyaz, A., and A. Castellazzi. High Temperature Pulsed-gate Robustness Testing of SiC Power MOSFETs. Elsevier, 2015.

MLA (9th ed.) Citation

Fayyaz, A., and A. Castellazzi. High Temperature Pulsed-gate Robustness Testing of SiC Power MOSFETs. Elsevier, 2015.

Warning: These citations may not always be 100% accurate.