Feng, X., Lacorne, C., Fernandes, G. Q., Lawes, S., & Kinnell, P. (2016). Contamination of µCMM stylus tips: On-machine inspection.
Chicago Style (17th ed.) CitationFeng, Xiaobing, Cyril Lacorne, Gustavo Q. Fernandes, Simon Lawes, and Peter Kinnell. Contamination of µCMM Stylus Tips: On-machine Inspection. 2016.
MLA (9th ed.) CitationFeng, Xiaobing, et al. Contamination of µCMM Stylus Tips: On-machine Inspection. 2016.
Warning: These citations may not always be 100% accurate.