Contamination of µCMM stylus tips: on-machine inspection

Contamination of µCMM stylus tips: on-machine inspection

Contamination adhered to the surface of a µCMM stylus tip significantly impairs the dimensional accuracy of a µCMM system. Regular cleaning of the stylus is essential to minimising the dimensional error but little data exists for determining appropriate cleaning intervals. This study investigates th...

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Bibliographic Details
Main Authors: Feng, Xiaobing, Lacorne, Cyril, Fernandes, Gustavo Q., Lawes, Simon, Kinnell, Peter
Format: Conference or Workshop Item
Published: 2016
Subjects:
stylus contamination
debris imaging
µCMM
Online Access:https://eprints.nottingham.ac.uk/33791/

Internet

https://eprints.nottingham.ac.uk/33791/

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