Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips

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Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips

The dimensional accuracy of a micro-CMM is significantly affected by contamination adhered to the stylus tip during use. Contaminant particles can cause dimensional errors that are orders of magnitude greater than those reported in the literature. To reduce such errors, this study evaluates the suit...

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Bibliographic Details
Main Authors:	Feng, Xiaobing, Lawes, Simon, Kinnell, Peter K.
Format:	Conference or Workshop Item
Published:	2015
Subjects:	cleaning capability; micro-CMM stylus tip; mechanical damage; thermal damage
Online Access:	https://eprints.nottingham.ac.uk/33788/

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