APA (7th ed.) Citation

Romano, G., Fayyaz, A., Riccio, M., Maresca, L., Breglio, G., Castellazzi, A., & Irace, A. (2016). A comprehensive study of the short-circuit ruggedness of silicon carbide power MOSFETs. IEEE.

Chicago Style (17th ed.) Citation

Romano, Gianpaolo, Asad Fayyaz, Michele Riccio, Luca Maresca, Giovanni Breglio, Alberto Castellazzi, and Andrea Irace. A Comprehensive Study of the Short-circuit Ruggedness of Silicon Carbide Power MOSFETs. IEEE, 2016.

MLA (9th ed.) Citation

Romano, Gianpaolo, et al. A Comprehensive Study of the Short-circuit Ruggedness of Silicon Carbide Power MOSFETs. IEEE, 2016.