APA (7th ed.) Citation

Gurpinar, E., Yang, Y., Iannuzzo, F., Castellazzi, A., & Blaabjerg, F. (2016). Reliability-driven assessment of GaN HEMTs and Si IGBTs in 3L-ANPC PV inverters. IEEE.

Chicago Style (17th ed.) Citation

Gurpinar, Emre, Yongheng Yang, Francesco Iannuzzo, Alberto Castellazzi, and Frede Blaabjerg. Reliability-driven Assessment of GaN HEMTs and Si IGBTs in 3L-ANPC PV Inverters. IEEE, 2016.

MLA (9th ed.) Citation

Gurpinar, Emre, et al. Reliability-driven Assessment of GaN HEMTs and Si IGBTs in 3L-ANPC PV Inverters. IEEE, 2016.