Agyakwa, P., Yang, L., Arjmand, E., Evans, P., Corfield, M., & Johnson, C. M. (2016). Damage evolution in Al wire bonds subjected to a junction temperature fluctuation of 30 K. Springer.
Chicago Style (17th ed.) CitationAgyakwa, Pearl, Li Yang, Elahjeh Arjmand, Paul Evans, Martin Corfield, and Christopher Mark Johnson. Damage Evolution in Al Wire Bonds Subjected to a Junction Temperature Fluctuation of 30 K. Springer, 2016.
MLA (9th ed.) CitationAgyakwa, Pearl, et al. Damage Evolution in Al Wire Bonds Subjected to a Junction Temperature Fluctuation of 30 K. Springer, 2016.
Warning: These citations may not always be 100% accurate.