Robustness analysis and experimental validation of a fault detection and isolation method for the modular multilevel converter

This paper presents a fault detection and isolation (FDI) method for open-circuit faults of power semiconductor devices in a modular multilevel converter (MMC). The proposed FDI method is simple with only one sliding mode observer (SMO) equation and requires no additional transducers. The method is...

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Bibliographic Details
Main Authors: Shao, Shuai, Watson, Alan James, Clare, Jon C., Wheeler, Patrick
Format: Article
Published: IEEE 2016
Subjects:
Online Access:https://eprints.nottingham.ac.uk/33361/