Phase and fringe order determination in wavelength scanning interferometry

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Phase and fringe order determination in wavelength scanning interferometry

A method to obtain unambiguous surface height measurements using wavelength scanning interferometry with an improved repeatability, comparable to that obtainable using phase shifting interferometry, is reported. Rather than determining the conventional fringe frequency-derived z height directly, th...

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Bibliographic Details
Main Authors:	Moschetti, Guiseppe, Forbes, Alistair, Leach, Richard K., Jiang, Xiang, O'Connor, Daniel
Format:	Article
Published:	Optical Society of America 2016
Online Access:	https://eprints.nottingham.ac.uk/32803/

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