Vladov, N., Segal, J., & Ratchev, S. (2015). Apparent beam size definition of focused ion beams based on scanning electron microscopy images of nanodots. AIP.
Chicago Style (17th ed.) CitationVladov, Nikola, Joel Segal, and Svetan Ratchev. Apparent Beam Size Definition of Focused Ion Beams Based on Scanning Electron Microscopy Images of Nanodots. AIP, 2015.
MLA (9th ed.) CitationVladov, Nikola, et al. Apparent Beam Size Definition of Focused Ion Beams Based on Scanning Electron Microscopy Images of Nanodots. AIP, 2015.
Warning: These citations may not always be 100% accurate.