Surface plasmon microscopic sensing with beam profile modulation

Surface Plasmon microscopy enables measurement of local refractive index on a far finer scale than prism based systems. An interferometric or confocal system gives the so-called V(z) curve when the sample is scanned axially, which gives a measure of the surface plasmon propagation velocity. We show...

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Bibliographic Details
Main Authors: Zhang, Bei, Pechprasarn, Suejit, Somekh, Michael G.
Format: Article
Published: Optical Society of America 2012
Online Access:https://eprints.nottingham.ac.uk/2869/

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