Surface plasmon microscopic sensing with beam profile modulation
Surface Plasmon microscopy enables measurement of local refractive index on a far finer scale than prism based systems. An interferometric or confocal system gives the so-called V(z) curve when the sample is scanned axially, which gives a measure of the surface plasmon propagation velocity. We show...
| Main Authors: | , , |
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| Format: | Article |
| Published: |
Optical Society of America
2012
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| Online Access: | https://eprints.nottingham.ac.uk/2869/ |