Surface plasmon microscopic sensing with beam profile modulation

Surface Plasmon microscopy enables measurement of local refractive index on a far finer scale than prism based systems. An interferometric or confocal system gives the so-called V(z) curve when the sample is scanned axially, which gives a measure of the surface plasmon propagation velocity. We show...

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Main Authors: Zhang, Bei, Pechprasarn, Suejit, Somekh, Michael G.
Format: Article
Published: Optical Society of America 2012
Online Access:https://eprints.nottingham.ac.uk/2869/
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author Zhang, Bei
Pechprasarn, Suejit
Somekh, Michael G.
author_facet Zhang, Bei
Pechprasarn, Suejit
Somekh, Michael G.
author_sort Zhang, Bei
building Nottingham Research Data Repository
collection Online Access
description Surface Plasmon microscopy enables measurement of local refractive index on a far finer scale than prism based systems. An interferometric or confocal system gives the so-called V(z) curve when the sample is scanned axially, which gives a measure of the surface plasmon propagation velocity. We show how a phase spatial light modulator (i) performs the necessary pupil function apodization (ii) imposes an angular varying phase shift that effectively changes sample defocus without any mechanical movement and (iii) changes the relative phase of the surface plasmon and reference beam to provide signal enhancement not possible with previous configurations.
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institution University of Nottingham Malaysia Campus
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publishDate 2012
publisher Optical Society of America
recordtype eprints
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spelling nottingham-28692020-05-04T16:35:05Z https://eprints.nottingham.ac.uk/2869/ Surface plasmon microscopic sensing with beam profile modulation Zhang, Bei Pechprasarn, Suejit Somekh, Michael G. Surface Plasmon microscopy enables measurement of local refractive index on a far finer scale than prism based systems. An interferometric or confocal system gives the so-called V(z) curve when the sample is scanned axially, which gives a measure of the surface plasmon propagation velocity. We show how a phase spatial light modulator (i) performs the necessary pupil function apodization (ii) imposes an angular varying phase shift that effectively changes sample defocus without any mechanical movement and (iii) changes the relative phase of the surface plasmon and reference beam to provide signal enhancement not possible with previous configurations. Optical Society of America 2012-12-03 Article PeerReviewed Zhang, Bei, Pechprasarn, Suejit and Somekh, Michael G. (2012) Surface plasmon microscopic sensing with beam profile modulation. Optics Express, 20 (27). pp. 28039-28048. ISSN 1094-4087 http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-20-27-28039 doi:10.1364/OE.20.028039 doi:10.1364/OE.20.028039
spellingShingle Zhang, Bei
Pechprasarn, Suejit
Somekh, Michael G.
Surface plasmon microscopic sensing with beam profile modulation
title Surface plasmon microscopic sensing with beam profile modulation
title_full Surface plasmon microscopic sensing with beam profile modulation
title_fullStr Surface plasmon microscopic sensing with beam profile modulation
title_full_unstemmed Surface plasmon microscopic sensing with beam profile modulation
title_short Surface plasmon microscopic sensing with beam profile modulation
title_sort surface plasmon microscopic sensing with beam profile modulation
url https://eprints.nottingham.ac.uk/2869/
https://eprints.nottingham.ac.uk/2869/
https://eprints.nottingham.ac.uk/2869/