EBIC study of Au / n-type GaN Schottky contacts

The performance of Au / n-type GaN Schottky contacts is strongly dependent on the GaN surface processing prior to contacting. Current-voltage and EBIC line scans demonstrate that KOH treatment acts to degrade the Schottky contacts. EBIC imaging reveals the differing sub-grain boundary structures o...

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Bibliographic Details
Main Authors: Moldovan, Grigore, Harrison, Ian, Brown, Paul D.
Other Authors: Cullis, A.G.
Format: Book Section
Published: IOP Publishing Ltd 2003
Subjects:
Online Access:https://eprints.nottingham.ac.uk/1464/