Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN

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Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN

A correlated current-voltage (I-V), electron beam induced conductivity (EBIC) and X-ray photoelectron spectroscopy (XPS) study of Au contacts to KOH treated n-type GaN is presented. A strong degradation of I-V characteristics occurs following the KOH treatment, mirrored in a reduction in the magnit...

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Bibliographic Details
Main Authors:	Moldovan, Grigore, Harrison, Ian, Roe, Martin, Brown, Paul D.
Other Authors:	McVitie, Stephen
Format:	Book Section
Published:	Institute of Physics Publishing 2004
Subjects:	I-V EBIC XPS GaN
Online Access:	https://eprints.nottingham.ac.uk/1444/

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