Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN
A correlated current-voltage (I-V), electron beam induced conductivity (EBIC) and X-ray photoelectron spectroscopy (XPS) study of Au contacts to KOH treated n-type GaN is presented. A strong degradation of I-V characteristics occurs following the KOH treatment, mirrored in a reduction in the magnit...
| Main Authors: | , , , |
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| Other Authors: | |
| Format: | Book Section |
| Published: |
Institute of Physics Publishing
2004
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| Subjects: | |
| Online Access: | https://eprints.nottingham.ac.uk/1444/ |