Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN
A correlated current-voltage (I-V), electron beam induced conductivity (EBIC) and X-ray photoelectron spectroscopy (XPS) study of Au contacts to KOH treated n-type GaN is presented. A strong degradation of I-V characteristics occurs following the KOH treatment, mirrored in a reduction in the magnit...
| Main Authors: | , , , |
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| Format: | Book Section |
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Institute of Physics Publishing
2004
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| Subjects: | |
| Online Access: | https://eprints.nottingham.ac.uk/1444/ |
| _version_ | 1848790607165652992 |
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| author | Moldovan, Grigore Harrison, Ian Roe, Martin Brown, Paul D. |
| author2 | McVitie, Stephen |
| author_facet | McVitie, Stephen Moldovan, Grigore Harrison, Ian Roe, Martin Brown, Paul D. |
| author_sort | Moldovan, Grigore |
| building | Nottingham Research Data Repository |
| collection | Online Access |
| description | A correlated current-voltage (I-V), electron beam induced conductivity (EBIC) and X-ray photoelectron spectroscopy (XPS) study of Au contacts to KOH treated n-type GaN is presented. A strong degradation of I-V characteristics occurs following the KOH treatment, mirrored in a reduction in the magnitude of the EBIC current, even though the EBIC images look visibly unaltered. XPS demonstrates a modification in the surfaces states, e.g. resulting in a –0.3eV shift in the binding energy of Ga3d for MBE GaN following KOH processing. |
| first_indexed | 2025-11-14T18:15:18Z |
| format | Book Section |
| id | nottingham-1444 |
| institution | University of Nottingham Malaysia Campus |
| institution_category | Local University |
| last_indexed | 2025-11-14T18:15:18Z |
| publishDate | 2004 |
| publisher | Institute of Physics Publishing |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | nottingham-14442020-05-04T20:31:38Z https://eprints.nottingham.ac.uk/1444/ Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN Moldovan, Grigore Harrison, Ian Roe, Martin Brown, Paul D. A correlated current-voltage (I-V), electron beam induced conductivity (EBIC) and X-ray photoelectron spectroscopy (XPS) study of Au contacts to KOH treated n-type GaN is presented. A strong degradation of I-V characteristics occurs following the KOH treatment, mirrored in a reduction in the magnitude of the EBIC current, even though the EBIC images look visibly unaltered. XPS demonstrates a modification in the surfaces states, e.g. resulting in a –0.3eV shift in the binding energy of Ga3d for MBE GaN following KOH processing. Institute of Physics Publishing McVitie, Stephen McComb, David 2004 Book Section PeerReviewed Moldovan, Grigore, Harrison, Ian, Roe, Martin and Brown, Paul D. (2004) Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN. In: Electron microscopy and analysis 2003: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics conference series (179). Institute of Physics Publishing, Bristol, pp. 115-118. ISBN 0750309679 I-V EBIC XPS GaN |
| spellingShingle | I-V EBIC XPS GaN Moldovan, Grigore Harrison, Ian Roe, Martin Brown, Paul D. Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN |
| title | Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN |
| title_full | Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN |
| title_fullStr | Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN |
| title_full_unstemmed | Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN |
| title_short | Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN |
| title_sort | correlation of electrical and structural properties of au contacts to koh treated n-gan |
| topic | I-V EBIC XPS GaN |
| url | https://eprints.nottingham.ac.uk/1444/ |