A damage-based time-domain wear-out model for wire bond interconnects in power electronic modules

In the Physics-of-Failure based approach to reliability design and assessment, which aims to relate lifetime to the identified root-cause of the potential failures, the development of effective failure mechanism models is a crucial task. The extent and rate of wire bond degradation depends on both...

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Bibliographic Details
Main Author: Yang, Li
Format: Thesis (University of Nottingham only)
Language:English
Published: 2013
Subjects:
Online Access:https://eprints.nottingham.ac.uk/13646/