The micro and nano scale characterization and identification of tablet formulations

The aim of this project was to characterize the surface properties of materials used in tablet formulations with sub-micron resolution by the techniques of Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM), Scanning Thermal Microscopy (SThM), Nano-TA system, Differential Scanning Cal...

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Bibliographic Details
Main Author: Jin, Zheng
Format: Thesis (University of Nottingham only)
Language:English
Published: 2010
Online Access:https://eprints.nottingham.ac.uk/11073/