Scanning Capacitance Microscopy in the Quantum Hall Regime

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Scanning Capacitance Microscopy in the Quantum Hall Regime

This thesis discusses the development of a novel scanning capacitance microscope (SCM) that enables the investigation of the local capacitance and conductivity of surfaces and near-surface nanostructures at cryogenic temperatures and high magnetic fields. Simultaneous atomic force microscopy (AFM)...

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Bibliographic Details
Main Author:	Suddards, Matthew Edmund
Format:	Thesis (University of Nottingham only)
Language:	English
Published:	2007
Subjects:	AFM Quantum hall effect SCM capacitance
Online Access:	https://eprints.nottingham.ac.uk/10356/

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