Scanning Capacitance Microscopy in the Quantum Hall Regime

This thesis discusses the development of a novel scanning capacitance microscope (SCM) that enables the investigation of the local capacitance and conductivity of surfaces and near-surface nanostructures at cryogenic temperatures and high magnetic fields. Simultaneous atomic force microscopy (AFM)...

Full description

Bibliographic Details
Main Author: Suddards, Matthew Edmund
Format: Thesis (University of Nottingham only)
Language:English
Published: 2007
Subjects:
Online Access:https://eprints.nottingham.ac.uk/10356/