APA (7th ed.) Citation

Lee , W. P. (2005). Optical Scattering Detection And Characterisation Of Crystal Originated Particles In Czochralski-Grown Silicon Wafers.

Chicago Style (17th ed.) Citation

Lee , Wah Pheng. Optical Scattering Detection And Characterisation Of Crystal Originated Particles In Czochralski-Grown Silicon Wafers. 2005.

MLA (9th ed.) Citation

Lee , Wah Pheng. Optical Scattering Detection And Characterisation Of Crystal Originated Particles In Czochralski-Grown Silicon Wafers. 2005.

Warning: These citations may not always be 100% accurate.