VHDL modelling of the open short tester
IC (Integrated Circuitry) testing requires the very advanced and sophisticated Advance Test Equipment (ATE) that costs multi million USD. The cost of IC testing is increasing yearly and it will exceed the cost of manufacturing in future. The manufacturers are interested to lower down the manufacturi...
| Main Authors: | , , , |
|---|---|
| Format: | Conference or Workshop Item |
| Language: | English |
| Published: |
World Scientific and Engineering Academy and Society (WSEAS)
2007
|
| Subjects: | |
| Online Access: | http://shdl.mmu.edu.my/3190/ http://shdl.mmu.edu.my/3190/1/VHDL%20modelling%20of%20the%20open%20short%20tester.pdf |