Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms
Due to the circuit complexity and the number of parameters involved, test relationship of a Test Program (TP) might not be fully discovered. Traditionally, TP setup are defined based on the domain expertise and gathered experience of an engineer. Such judgment is time consuming and could be ineffici...
| Main Authors: | , , , |
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| Format: | Conference or Workshop Item |
| Published: |
2007
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| Online Access: | http://shdl.mmu.edu.my/3188/ |
| _version_ | 1848790258485821440 |
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| author | Lee, Jia Keat Phon-Amnuaisuk, Somnuk Chew, Huat Chin Ho, Chin Kuan |
| author_facet | Lee, Jia Keat Phon-Amnuaisuk, Somnuk Chew, Huat Chin Ho, Chin Kuan |
| author_sort | Lee, Jia Keat |
| building | MMU Institutional Repository |
| collection | Online Access |
| description | Due to the circuit complexity and the number of parameters involved, test relationship of a Test Program (TP) might not be fully discovered. Traditionally, TP setup are defined based on the domain expertise and gathered experience of an engineer. Such judgment is time consuming and could be inefficient especially when new products and technologies are rapidly developed for the competing market. If the complexity of a TP increases, the undetected interrelationship among tests in a TP will also increase. In this paper, inferences are performed to a huge and complex TP using different classification algorithms, with the primary goal to discover potential test relationships in a fast and efficient way. The mining output can be used as a reference and basis for test engineers to improve TP setup or to reprogram test machine to replace current exhaustive test policy. |
| first_indexed | 2025-11-14T18:09:45Z |
| format | Conference or Workshop Item |
| id | mmu-3188 |
| institution | Multimedia University |
| institution_category | Local University |
| last_indexed | 2025-11-14T18:09:45Z |
| publishDate | 2007 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | mmu-31882011-10-07T05:57:23Z http://shdl.mmu.edu.my/3188/ Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms Lee, Jia Keat Phon-Amnuaisuk, Somnuk Chew, Huat Chin Ho, Chin Kuan T Technology (General) QA75.5-76.95 Electronic computers. Computer science Due to the circuit complexity and the number of parameters involved, test relationship of a Test Program (TP) might not be fully discovered. Traditionally, TP setup are defined based on the domain expertise and gathered experience of an engineer. Such judgment is time consuming and could be inefficient especially when new products and technologies are rapidly developed for the competing market. If the complexity of a TP increases, the undetected interrelationship among tests in a TP will also increase. In this paper, inferences are performed to a huge and complex TP using different classification algorithms, with the primary goal to discover potential test relationships in a fast and efficient way. The mining output can be used as a reference and basis for test engineers to improve TP setup or to reprogram test machine to replace current exhaustive test policy. 2007-11 Conference or Workshop Item NonPeerReviewed Lee, Jia Keat and Phon-Amnuaisuk, Somnuk and Chew, Huat Chin and Ho, Chin Kuan (2007) Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms. In: International Symposium on Information Technology Convergence, 23-24 NOV 2007 , Jeonju, SOUTH KOREA. http://dx.doi.org/10.1109/ISITC.2007.45 doi:10.1109/ISITC.2007.45 doi:10.1109/ISITC.2007.45 |
| spellingShingle | T Technology (General) QA75.5-76.95 Electronic computers. Computer science Lee, Jia Keat Phon-Amnuaisuk, Somnuk Chew, Huat Chin Ho, Chin Kuan Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms |
| title | Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms |
| title_full | Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms |
| title_fullStr | Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms |
| title_full_unstemmed | Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms |
| title_short | Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms |
| title_sort | manufacturing test data analysis-on comparing different classification algorithms |
| topic | T Technology (General) QA75.5-76.95 Electronic computers. Computer science |
| url | http://shdl.mmu.edu.my/3188/ http://shdl.mmu.edu.my/3188/ http://shdl.mmu.edu.my/3188/ |