Manufacturing Test Data Analysis-On Comparing Different Classification Algorithms
Due to the circuit complexity and the number of parameters involved, test relationship of a Test Program (TP) might not be fully discovered. Traditionally, TP setup are defined based on the domain expertise and gathered experience of an engineer. Such judgment is time consuming and could be ineffici...
| Main Authors: | , , , |
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| Format: | Conference or Workshop Item |
| Published: |
2007
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| Subjects: | |
| Online Access: | http://shdl.mmu.edu.my/3188/ |